CompTIA A Certification All in One Exam Guide Seventh Edition Exams 220 701 220 702

Written by the leading authority on CompTIA A+ certification and training, this expert guide covers CompTIA A+ exams 220-701 and 220-702.

CompTIA A  Certification All in One Exam Guide  Seventh Edition  Exams 220 701   220 702

Author: Michael Meyers

Publisher: Mcgraw-hill

ISBN: 9780071701334

Page: 1376

View: 328

Get complete coverage of the latest release of the CompTIA A+ exams inside this fully revised and updated resource. Written by the leading authority on CompTIA A+ certification and training, this expert guide covers CompTIA A+ exams 220-701 and 220-702. You'll find learning objectives at the beginning of each chapter, exam tips, practice exam questions, in-depth explanations, and more than 1,000 photographs and illustrations. Designed to help you pass the CompTIA A+ exams with ease, this definitive volume also serves as an essential on-the-job IT reference. Covers all exam objectives, including how to: Work with CPUs, RAM, motherboards, power supplies, and other PC components Install, partition, and format hard drives Install, upgrade, and troubleshoot WIndows 2000, Windows XP, and Windows Vista Troubleshoot PCs and implement security measures Install video and multimedia cards Work with portable PCs, PDAs, smartphones, and wireless technologies Manage printers and connect to networks and the Internet Understand safety and environmental issues Establish good communication skills and adhere to privacy policies The CD-ROM features: Practice exams for 701 & 702 600+ chapter review questions New video introduction to CompTIA A+ One-hour video training segment Mike's favorite PC tools and utilities Searchable e-book Mike Meyers, CompTIA A+, CompTIA Network+, MCP, is the industry's leading authority on CompTIA A+ certification and training. He is the president and founder of Total Seminars, LLC, a major provider of PC and network repair seminars for thousands of organizations throughout the world, and a member of CompTIA.

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